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破局!内外兼修的UVD提升芯片调试效率

2022-12-05

随着SoC芯片复杂度、集成度的提升,传统验证调试手段已然难于满足超大芯片开发对验证效率和覆盖率的要求,加上传统验证调试工具协同性差以及一直存在的项目进度压力,业内迫切需要一个更稳定、更高效、兼容性更好的验证调试平台。

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